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Optical Metrology System

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BERGISCH GLADBACH, Germany, Sept. 30, 2015 — Optical Metrology SystemFRT Fries Research & Technology GmbH has announced the MicroProf 100 optical metrology system with multisensor technology.

Point and area sensor integration allows the investigation of a range of surfaces from smooth to rough and matte to transparent. Depending on the dimensions, up to three sensors and a camera can be installed.

The MicroProf 100 can be extended for double-sided sample inspection and determining sample thickness during the same measurement process. The XY table travel range is 150 × 100 mm, suitable for the individual measurement of small parts in tray during production. The tabletop system can also be used in R&D labs.
Sep 2015

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ProductsTest & MeasurementMicroProf 100metrologyFries Research & TechnologyFRTGermanyEurope

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