Optical Profiler
Sensofar MetrologyRequest Info
The S neox optical profiler from Sensofar Metrology is a high-performance, noncontact 3D microscope system designed for subnano, nano, and micro-scale measurement, with advanced inspection and analysis capabilities.
With smart algorithms, data acquisition is taken at 180 fps, measures the shape of large rough surfaces, and has been improved to provide a more reliable focus location, even on optically smooth surfaces. A thin-film measurement technique allows the user to quickly, accurately, and nondestructively measure the thickness of optically transparent layers. Transparent films from 50 nm to 1.5 μm can be measured in <1 s.
The S neox comes equipped with a four long-lifetime LED light sources and a six-position motorized nosepiece.
https://www.sensofar.com/metrology
https://www.photonics.com/Buyers_Guide/Sensofar_Metrology/c13403
Photonics Spectra
Sep 2019
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