Optical Profilometer
Bruker Nano SurfacesRequest Info
BILLERICA, Mass., Feb. 20, 2023 —
The NPFLEX-1000 optical profilometer from Bruker Corp. features large form-factor gantry and robust bridge architecture for fast, automated areal measurements of surface texture and roughness.
The white-light interferometry system provides sample-size flexibility with 300 mm of space below the objective lens, a swivel head, and long working distance objectives. In addition, high-slope surface access is significantly extended via a fold mirror option. Fast, automated measurements and full analysis is possible within 10 s, translating to improvements in throughput for production environments.
https://www.bruker.com/nano
https://www.photonics.com/Buyers_Guide/Bruker_Nano_Surfaces/c19385
Photonics.com
Feb 2023