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Optical Spectrometer

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CHELMSFORD, Mass., Nov. 23, 2009 – McPherson Inc.’s 248/130 grazing incidence wavelength dispersive optical spectrometer allows rapid analysis of spectral light in the ~1- to 300-nm wavelength region (4 to ~1200 eV.) It is useful for spectroscopy in the vacuum ultraviolet and also the extreme and soft-x-ray wavelength regions.
Using direct detection CCDs, gated image intensifiers, or fast channel electron multipliers for detection, it provides a wide working range and flexibility in spectral acquisition. The instrument is completely assembled, vacuum leak checked and calibrated with respect to wavelength. It can include adapters, differential pumping and grazing incidence collection optics to more easily connect to the experiment.

Every shipment is complete with a wavelength calibration certification. For the user, this facilitates rapid identification of closely spaced high harmonics. The spectrometer is not just for laser applications. Space scientists and plasma physicists who need a ready instrument for vacuum ultraviolet and extreme ultraviolet also capitalize on the instrument’s range and flexibility. Configured in reverse, it operates as a tunable light source.

Vacuum ultraviolet spectroscopy accessories including various detector systems and wavelength calibration sources are available from <1 nm to the visible.

For more information, visit:  

McPherson Inc.
7A Stuart Road
Chelmsford MA 01824-4107
Phone: (978) 256-4512
Fax: (978) 250-8625
Nov 2009

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Sensors & Detectors
AmericaBiophotonicscalibrateddirect detection CCDselectron multipliersgated image intensifiersgrazing incidenceMassachusettsMcPhersonopticalphotonicsphotonics.complasma physicistsProductsreverse configurationSensors & Detectorssoft-x-rayspace scientistsSpectrometerspectroscopyTest & Measurementtunable light sourcevacuum leak checkedvacuum UVwavelength calibration certificationwavelength dispersiveXUVlasers

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