Optoelectronic Probe Card
Jenoptik Optical Systems GmbH, Optical SystemsRequest Info
JENA, Germany, Dec. 30, 2020 — 
The UFO Probe™ Card from Jenoptik AG is designed for photonic integrated circuit (PIC) wafer-level testing on semiconductor chips.
The novel optical solution for integration into electrical test cards is insensitive to alignment tolerances in the wafer prober. The card can be used with commercially available wafer probers, ensuring a high throughput for testing photonic integrated circuits and combining electrical and optical tests in one solution. Multiple optical and electrical channels of a PIC or even several PICs can be tested in parallel, regardless of their arrangement, thus meeting the demand of optoelectronic tests for high-volume applications.
The design of the probe card can be customized to meet specific requirements such as individual PIC layout and specific test arrangement.
https://www.jenoptik.com/os
https://www.photonics.com/Buyers_Guide/Jenoptik_Optical_Systems_GmbH_Optical_Systems/c17723
Photonics.com
Dec 2020