Optoelectronic Probe Card
Jenoptik Optical Systems GmbH, Optical SystemsRequest Info
The UFO Probe™ Card from Jenoptik AG is designed for photonic integrated circuit (PIC) wafer-level testing on semiconductor chips.
The novel optical solution for integration into electrical test cards is insensitive to alignment tolerances in the wafer prober. The card can be used with commercially available wafer probers, ensuring a high throughput for testing photonic integrated circuits and combining electrical and optical tests in one solution. Multiple optical and electrical channels of a PIC or even several PICs can be tested in parallel, regardless of their arrangement, thus meeting the demand of optoelectronic tests for high-volume applications.
The design of the probe card can be customized to meet specific requirements such as individual PIC layout and specific test arrangement.
https://www.jenoptik.com/os
https://www.photonics.com/Buyers_Guide/Jenoptik_Optical_Systems_GmbH_Optical_Systems/c17723
Photonics Spectra
Apr 2021
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to Jenoptik Optical Systems GmbH, Optical Systems by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required