Search Menu
Photonics Media Photonics Marketplace Photonics Spectra BioPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook

PLu neox Forensic Metrology System

Sensofar MetrologyRequest Info
Facebook Twitter LinkedIn Email
The PLu neox noncontact optical forensic metrology system from Sensofar features a dual-technology sensor head that combines confocal and interferometric techniques to obtain fast and noninvasive measurements of the micro- and nanogeometry of bullet surfaces.

The system uses a forensic-specific extension of proprietary SensoMAP software to objectively compare bullet surface features by producing a single correlation value. This value is used by forensic scientists to assess the quality of a microscopic comparison between a test bullet and a bullet recovered from a crime scene.

Dec 2013

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address 2:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to Sensofar Metrology by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
bullet surfacesbulletsEuropeforensicsmetrologyoptical metrology systemopticsPLu neoxProduct PreviewProductsSensofarSensoMAP softwareSensors & DetectorsSpainTest & Measurement

back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2023 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, [email protected]

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.