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PhaseCam 6000 Interferometer

4D Technology CorporationRequest Info
 
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TUCSON, Ariz., Feb. 16, 2010 – The PhaseCam 6000 manufactured by 4D Technology Corp. is a compact and lightweight Twyman-Green interferometer for measurement of optics and optical systems. With an easy-to-position, fiber-coupled measurement head and motorized controls, it is suitable for on-machine metrology, remote mounting in measurement towers or pressure vessels, and other challenging applications and environments, and it provides wavefront and shape measurement of general optics, large optics and optical systems.

The turnkey system uses Dynamic Interferometry to acquire all measurement information in a single exposure, more than 5000 times faster than a conventional, phase-shifting interferometer, according to the company. The high-speed optical phase sensor makes wavefront measurements in 30 µs. This near-instantaneous measurement speed makes the instrument insensitive to vibration and air turbulence, enabling measurement in noisy environments such as cleanrooms and manufacturing facilities. Its immunity to air turbulence enables accurate measurement of long radius-of-curvature optics, where the instrument may be located tens of meters from the test optic.

Included is a 1000 × 1000-pixel camera, a computer system and 4Sight analysis software that provides extensive 2-D, 3-D, Seidel, geometric, diffraction and Zernike analysis options, as well as data filtering, masking, database and import/export functions. The stabilized HeNe 632.8-nm laser provides good coherence stability.

Applications include in situ process control, quality verification of optical components, vacuum and environmental chamber testing, focal optical systems, optical testing of moving parts, and measurement of large, focal optical systems such as concave telescope mirrors and lens systems, as well as deformable mirrors and adaptive optics. Numerous accessories and options are available including a five-axis mount, low-reflectivity diverging lenses, beam expanders and wavelength options. 




Published: February 2010
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