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Photovoltaic System

CRAIC TechnologiesRequest Info
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CRAIC.jpgCraic Technologies Inc. has launched its QDI 2010 Film, a microspectrophotometer designed to rapidly and nondestructively measure the thickness of thin films of photovoltaic cells. Combining microspectroscopy with software, it enables the user to measure film thickness by either transmission or reflectance of many types of materials and substrates. Sampling area ranges from >1 to >100 μm. When combined with the company’s contamination imaging capabilities, it can test the transmissivity of photovoltaic cell protective covers. Contamination analysis and transmissivity testing can be added easily to the instrument.

Photonics Spectra
Oct 2009

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contamination analysiscontamination imagingCraicCraic Technologies Inc.energyfilm thicknessimagingmicrospectrometerNew ProductsphotovoltaicsPVsQDI 2010 Film microspectrometerReflectancesolar cellssubstratesthicknessthin filmstransmissiontransmissivity

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