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Keithley Instruments Inc.Request Info
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Keithley Instruments Inc. has introduced a picoammeter with dual ±30-V, independent, nonfloating bias sources and 1-fA measurement resolution. Model 6482 provides two independent picoammeter/source channels in a 2U, half-rack enclosure, allowing simultaneous measurements across both channels. Measurement accuracy is ±1% on the 2-nA range, and dynamic range is from 1 fA to 20 mA.

The wide measurement range ensures high sensitivity and resolution for low-current applications that require making measurements at multiple points simultaneously.

The 2-nA measurement range is suitable for measuring dark and other low currents. Once the level of dark current has been determined, the instrument’s relative function automatically subtracts the dark current as an offset so the measured values are more accurate for optical power measurements. For measuring the dark currents of photodiodes or other light-sensitive components, the front panel display can be switched off to avoid introducing light that would interfere with obtaining accurate results.

The instrument provides ratio or delta measurements between the two isolated channels. These functions can be accessed via the front panel or the GPIB interface.

To speed and simplify system integration and control when building multi-instrument test systems that require tightly coupled sourcing and measurement, Model 6482 provides the Trigger Link feature as well as standard GPIB and RS-232 interfaces. The Trigger Link combines six independent software-selectable trigger lines on a single connector for direct control over all instruments in a system.

Applications include manufacturing component testing, dual-diode testing, semiconductor component testing, multipin component testing, dark current measurements, ion beam monitoring and electron microscopy.

For more information, visit:

Jan 2013

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AmericasBiophotonicsBreakthroughProductsdelta measurementsdual-diode testingelectron microscopyElectronics & Signal AnalysisGPIB interfaceindustrialion beam monitoringKeithley Instrumentslow-current applicationsmanufacturing component testingmeasure dark currentsMicroscopyModel 6482multipin component testingNew ProductsOhiophotodiodespicoammeterProductsratio measurementsRS-232semiconductor component testingTest & MeasurementTrigger Link feature

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