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Purged UV Spectrometer

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McPherson has launched its latest VUVAS scientific-grade spectrophotometer. The instrument provides stable measurements over time and is easy to maintain.

With a long lamp life at short ultraviolet wavelengths (120 nm), it is suited to analysis of doped and crystalline materials as well as deep-UV optics and coatings. It provides direct optical characterization of transmission, variable angle reflectance and gas cell absorbance (optional). It also offers precise, reproducible wavelength control throughout the 120- to 350-nm wavelength region, and sensitive signal recovery with “lock-in” detectors controlled by software. McPherson Spectrometer Control Software provides single-point control for scanning and data acquisition.

As part of the VUVAS family, corrected and single-beam instruments are available with environmental controls (vacuum or the new purged versions). The new VUVAS controls yield more rapid and reproducible measurements in an environment that minimizes sample contamination while extending lamp life via purge controls that integrate sensitive oxygen sensors and automatic low- and high-flow purge gas channels.

The VUVAS provides a powerful tool for direct optical measurements from 120 to 350 nm. Available accessories include light sources, detectors and sample chambers.

Photonics Spectra
Jul 2012
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Americasanalyze crystalline materialsanalyze deep-UV opticsanalyze doped materialscoatingsMassachusettsMcPhersonMcPherson Spectrometer Control SoftwareNew Productsoptical characterization gas cell absorbanceoptical characterization transmissionoptical characterization variable angle reflectanceProductspurged UV spectrometerscientific-grade spectrophotometerSensors & DetectorsSpectrometerspectroscopyTest & MeasurementVUVAS

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