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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

20/20 XL

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CRAIC Technologies
SAN DIMAS, Calif., May 13, 2011 — Craic Technologies Inc. has announced the 20/20 XL UV-visible-NIR microspectrophotometer designed to nondestructively analyze microscopic features of very large displays by incorporating large-scale sample handling. With a spectral range from the deep-ultraviolet to the near-infrared, it analyzes samples by absorbance, reflectance, luminescence and fluorescence with high speed and accuracy. The system also can be configured to image microscopic samples in the UV and NIR. Applications include mapping color and intensity variations, film thickness measurements, microcolorimetry and...See full product

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