Request InfoVeeco Instruments Inc.Veeco Instruments Inc. has developed the HarmoniX atomic force microscope (AFM) technique by which users can simultaneously capture quantitative maps of material properties such as elasticity, adhesion, dissipation and peak force. It is available on all of the company’s scanning probe microscopes that are powered by the NanoScope V controller and probes. HarmoniX acquires real-time force curves by measuring the cantilever’s torsional motion each time the AFM tip interacts with the surface, and proprietary analyses instantly calculate sample characteristics and provide results in image maps...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics May/Jun 2023 IssueKinetic Plate ImagerThe FDSS-GX kinetic plate imager from Hamamatsu Photonics KK is designed for kinetic cell-based assay development including G-protein-coupled receptors or ion channel research and screening for drug...Promoted Content March 2024 IssueRaman MicroscopeThe alpha300 Semiconductor Edition from WITec is a Raman microscope configured especially for semiconductor research and development. 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