Request InfoMKS Ophir, Light & MeasurementAdditive chambers are challenging for high-power laser analysis due to the environment and space constraints. The Ophir® BeamPeek™ integrated beam analysis and power measurement system delivers fast, accurate, real-time measurement of 1-KW green and NIR lasers in additive chambers. Simultaneously measures beam profiling, focal spot analysis, and power in three seconds. No need for active cooling.See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 11/22/2023Laser 3D Printing SoftwareSCANmotionControl software from SCANLAB GmbH is an end-to-end software chain designed for use in laser powder bed fusion additive manufacturing. The software enables the user to synchronize the scan...Photonics Spectra October 2023 IssueEmissions Analytics Lidar PlatformQuantum Gas Lidar and the QLM Cloud from QLM Technology Ltd. is a comprehensive solution for emissions measurement and quantification. The lidar utilizes quantum photonics detection and tunable...Promoted Content December 2022 IssueShort Cycle Times in Alignment TurningThe ATS alignment turning stations from TRIOPTICS combine the proven OptiCentric® centration technology with a highly precise turning machine. The new ATS-C model was recently presented at the...Photonics Showcase December 2023 IssueID FentanylFentanyl is a real problem. Metrohm has the solution. Whether on the street or in the lab, ensure safe and accurate results with one easy scan.ARTICLESPhotonics.com 3/8/2024Researchers Develop AI-Enabled Liquid Holographic CameraHolography technology can restore the complete light field information of the recorded object, which has important applications in fields like biological microscopic imaging and optical...Photonics.com 11/18/2022Bruker Acquires Neurescence; VIAVI Opens Arizona Facility: Week in Brief: 11/18/22Bruker signed a definitive agreement to acquire 100% of the shares of Neurescence, a medical imaging company. Neurescence’s ultralight fiber-bundle multiscopes allow simultaneous multiregion,...Photonics.com 6/9/2023ZEISS to Provide Metrology Software for 3D Scan SolutionsZEISS and 3D scanner and measurement systems developer Scantech are partnering to offer Scantech scanners with ZEISS inspection software. The collaborations seeks to enhance the performance of...Photonics Spectra April 2024 IssueUltrafast Phenomenon Prompts Data Storage Efficiency HypothesisA recent discovery from the University of California, Davis (UC Davis), could enable faster and more efficient magnetic hard drives by using ultrafast laser pulses to process data. The findings could...PHOTONICS HANDBOOK ARTICLESPhotonics HandbookSpectrum Analysis for DWDM: New Instruments Meet the ChallengeAs system and cable installers try to optimize their links, the preferred method has become high-speed DWDM. This demand for bandwidth has led to the development of new test and measurement...Photonics HandbookAspheric Lenses: Optimizing the DesignWith the understanding of aspheric lens manufacturing provided in part one of this article, designers have the tools to optimize their aspheres; the next step is to understand how to specify and...Photonics HandbookParticle Image Velocimetry: Basics, Developments and TechniquesParticle image velocimetry (PIV) is an experimental tool in fluid mechanics and aerodynamics. The basic principle involves photographic recording of the motion of microscopic particles that follow...Photonics HandbookColorimetry: How to Measure Color DifferencesThe use and importance of colorimetry has grown in unison with the increase of global manufacturing and processing. When plastic automotive trim produced on one continent must match a painted metal...WHITEPAPERSPhotonics.com 7/3/2023Polarization Metrology of Anisotropic MaterialsFull Mueller matrix measurements allow for elimination of ambiguity and a fuller understanding of polarization metrology. The Exicor 150XT system offers complete Mueller matrix measurement from 350...Photonics.com 10/19/2022Multiphoton Imaging of Mouse IntestineTwo-photon excited fluorescence (2PEF) and second harmonic generation (SHG) are complementary multiphoton imaging techniques for studying biological samples. Both utilise femtosecond pulsed infrared...Photonics.com 10/26/2022Methods of Imaging with Photoelastic ModulatorsThis paper highlights a range of options to utilize Photoelastic Modulators (PEMs) with imaging systems to generate full field polarimetric measurements. Due to the resonant nature of the...Photonics.com 2/28/2024Emerging Challenges in Smart Glass QualityMeasuring and calibrating LED edge-lit sunroofs.VIDEOSPhotonics.com 8/24/2022Ramacle® Software Highlight: Fast Mapping - Edinburgh InstrumentsThis Software Highlight focuses on Fast Mapping in our Ramacle software. Fast Mapping enables the user to acquire Raman maps with significantly reduced acquisition times via more efficient stage...Photonics.com 6/18/2021LumiTop X20 - Soon to come! - Instrument Systems GmbHInstrument Systems presents a special highlight: The preview of the new LumiTop X20, upcoming in autumn 2021. Building on the established 2700 and 4000 models, the LumiTop X20 will offer a high...Photonics.com 4/8/2019Lacroix - Measuring Aspheres in a 3D WorldThis video hits the key points made in our "Measuring Aspheres in a 3D World" white paper. 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The Ophir product portfolio consists of laser and LED measurement products, including laser power and energy meters, laser...Photonics Buyers' GuideOptikos CorporationThe Optical Engineering Experts® Optikos designs and manufactures metrology products for measuring and assuring optical image quality; and provides optical engineering design, development,...Photonics Buyers' GuideDataRay Inc.DataRay Inc. was founded in 1988 with a mission to advance the technology of laser beam analysis. We develop standard and custom laser beam characterization solutions that exceed customer...Photonics Buyers' GuideApre InstrumentsStay ahead of your competition with interferometers the meet today's manufacturing challenges. Äpre interferometers have the highest resolution, largest native aperture range, and lowest retrace...