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Additive Laser Measurement

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MKS Ophir, Light & Measurement
Additive chambers are challenging for high-power laser analysis due to the environment and space constraints. The Ophir® BeamPeek™ integrated beam analysis and power measurement system delivers fast, accurate, real-time measurement of 1-KW green and NIR lasers in additive chambers. Simultaneously measures beam profiling, focal spot analysis, and power in three seconds. No need for active cooling.See full product

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