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Analytical Field-Emission SEM

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JEOL USA Inc.
JEOL USA Inc.’s series of field-emission scanning electron microscopes (SEMs) is now complete with the introduction of the JSM-7800F for nanotechnology imaging and analysis. The microscope makes it possible to observe the finest structural morphology of nanomaterials at 1,000,000× magnification with sub-1-nm resolution; perform low-kilovolt imaging and analysis of highly magnetic samples; collect large-area electron backscatter diffraction maps at low magnifications without distortion; and image thin, electron-transparent samples with sub-0.8-nm resolution using an optional...See full product

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