Request InfoVeeco Instruments Inc.PLAINVIEW, N.Y., Feb. 10, 2009 – Veeco Instruments Inc. has released its Dimension Icon atomic force microscope (AFM). Building upon a large-sample platform, the microscope delivers high resolution, ease-of-use and fast time-to-results. It is designed to address the needs of both the research lab and industrial applications. Users can perform analysis ranging from quantitative automated characterization to atomic scale imaging in materials science, semiconductor, data storage and energy research applications. Many of the microscope’s features were engineered specifically to enhance technical performance and to increase...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 8/22/2022NAN Open-Design Upright MicroscopeThe Sutter Instrument NAN™ is a focusing nosepiece microscope designed for patch clamp electrophysiology or material science. 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