Request InfoOxford Instruments Asylum ResearchAsylum Research’s new MFP-3D Origin atomic force microscope (AFM) has full upgrade potential to the MFP-3D and its complete range of environmental and advanced application accessories. The MFP-3D features closed-loop precision, high-resolution imaging and low-noise force measurements. The MFP-3D Origin includes advanced modes such as nanolithography, the proprietary Dual AC mode and piezoresponse force microscopy. Additional advanced functionality is available for optional modes such as conductive AFM, AM-FM viscoelastic mapping for nanomechanical analysis, scanning tunnelling...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics Sep/Oct 2022 IssueMicrospectrophotometerThe FLEX PRO™ UV-VIS-NIR microspectrophotometer from CRAIC Technologies is a multifunctional tool able to acquire microscale images and spectra from the deep UV to the NIR. 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