Request InfoArmstrong Optical Ltd.NORTHAMPTON, England, Aug. 1, 2011 — A noncontact high-precision sensor that provides thickness measurement of infrared silicon and other semiconductor substrate wafers, doped or undoped, has been unveiled by Precitec Optronik and is available through Armstrong Optical Ltd. The CHRocodile IT sensor system is based on laser diode technology and offers thickness measurement in the range from 18 µm to 3 mm in air, with a resolution of better than 60 nm for silicon. It performs in-line measurements at a 4-kHz sampling rate and can operate in a vacuum. 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