Request InfoJEOL USA Inc.A new cold field emission gun (FEG) from JEOL USA Inc. enhances the ultrahigh atomic-level resolution of the company’s JEM-ARM200F aberration-corrected scanning/scanning transmission electron microscope. Now outfitted with the optional and field-retrofittable cold FEG, the JEM-ARM200F has ultrahigh imaging resolution that is guaranteed at 78 pm with an energy resolution of 0.3 eV. The higher brightness and smaller source size of the cold FEG produce a smaller, sharper electron probe with a larger probe current, resulting in enhanced atom-by-atom imaging and chemical analysis. The...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics Sep/Oct 2022 IssueMicrospectrophotometerThe FLEX PRO™ UV-VIS-NIR microspectrophotometer from CRAIC Technologies is a multifunctional tool able to acquire microscale images and spectra from the deep UV to the NIR. 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