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Dual AC Imaging Mode for AFM

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Asylum Research
SANTA BARBARA, Calif., Sept. 6, 2006 -- Atomic force microcope (AFM) maker Asylum Research announces an exclusive new imaging mode, Dual AC, that goes beyond conventional phase imaging in measuring the mechanical and chemical properties of samples by employing higher resonance modes of cantilevers. The patent-pending Dual AC Mode is available only on the Asylum Research MFP-3D AFM.Asylum Research's Dual AC mode shows strikingly different contrast from the fundamental amplitude and phase signals that are used in AC imaging mode. In this 10-µm scan made of graphite, "A" (top left) is the height image, "B" (top right) is the...See full product

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