Request InfoMcPHERSONCHELMSFORD, Mass., Jan. 12, 2009 – McPherson Inc. has released an x-ray and extreme ultraviolet (EUV) spectrometer, the 251MX, for wavelength dispersive spectral measurements from 0.6 to 20 nm (60 to 2000 eV.) The device provides corrected flat-field spectra with its selection of diffraction gratings. Data is acquired quickly and easily with direct-detection CCDs. The clean stainless steel chamber and vacuum-prepared internal components enable efficient pumping for high- or ultrahigh-vacuum (UHV) applications. The small footprint simplifies systems integration. The two available gratings, for 0.6 to 6 nm and 5 to 20 nm have...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 12/12/2022Optical Sensing InterrogatorsFemto Sensing International has expanded its SX line of optical sensing interrogators for high-sensor-count fiber Bragg grating (FBG) applications. 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