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BAE Systems Sensor Solutions - Fairchild - Thermal Imaging Solutions 4/24 LB

EUV Spectrometer

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McPHERSON
CHELMSFORD, Mass., Dec. 10, 2015 — McPherson Inc. has announced the Model 248/310 high-energy grazing-incidence wavelength-dispersive extreme-ultraviolet (EUV) spectrometer, allowing rapid analysis of light in the 1- to 300-nm wavelength region. Beside high-harmonic laser generation experiments, the device is also useful for measuring ion or discharge light sources and astrophysics detector calibration. The spectrometer uses angles between 84° and 88.5° throughput to energies around 1200 eV. The device is designed for space scientists and plasma physicists who require an instrument for vacuum-ultraviolet...See full product

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