Request InfoRudolph Technologies Inc.A transparent film metrology system from Rudolph Technologies Inc., called the SpectraLaser UTF, provides guaranteed subangstrom thickness accuracy of ±0.5 A and tool-to-tool matching of ±0.1 A. The system can characterize ultrathin films and ultrathin film stacks. It is suitable for semiconductor wafer manufacturing applications where all chips must have identical film thicknesses.See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra April 2023 IssueLaser Phase Lock SystemThe OE5000 Hi-Q Laser Phase Lock System from OEwaves Inc. allows the offset locking of two individual lasers separated in frequency by as much as 50 GHz. 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