Request InfoKrellTechKrell Technologies Inc.'s SpecMap interferometric inspection systems for connector polish diagnostics, quality assurance and process control applications measure surface geometries of single-fiber connectors and multifiber arrays containing up to 72 fibers. They feature high-speed data acquisition and analysis. Their noncontact technique eliminates damage to or contamination of the connector, and their blue-LED illumination increases vertical accuracy to 4 nm. Autofocus and inherent vibration resistance enable repeatable measurements in various environmental conditions, and an integrated...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 5/31/2022Plasma Process AnalyzersThe ESPion series of Langmuir probes from Hiden Analytical Ltd. are bolt-on plasma process analyzers designed for plasma diagnostics. 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