Request InfoCarl Zeiss Ltd.PEABODY, Mass., March 26, 2009 – Carl Zeiss SMT has introduced its Auriga CrossBeam focused ion beam/scanning electron microscopy (FIB/SEM) workstation. To characterize samples on the nanometer scale, it performs chemical analysis and provides complete morphology and crystallographic and electrical information. The workstation has a redesigned vacuum chamber that includes 15 ports for different detectors. The charge compensation system enables local application of an inert gas flush so that electrostatic charging of nonconductive samples is neutralized, and detection of secondary and backscattered electrons is possible....See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 2/28/2023Piezo Objective ScannerThe Nano Scan OP800 piezo objective scanner from Prior Scientific Inc. features a mechanical design and integral capacitive feedback for positioning accuracy. 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