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BAE Systems Sensor Solutions - Fairchild - Thermal Imaging Solutions 4/24 LB

Flexible Workstation

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Carl Zeiss Ltd.
PEABODY, Mass., March 26, 2009 – Carl Zeiss SMT has introduced its Auriga CrossBeam focused ion beam/scanning electron microscopy (FIB/SEM) workstation. To characterize samples on the nanometer scale, it performs chemical analysis and provides complete morphology and crystallographic and electrical information. The workstation has a redesigned vacuum chamber that includes 15 ports for different detectors. The charge compensation system enables local application of an inert gas flush so that electrostatic charging of nonconductive samples is neutralized, and detection of secondary and backscattered electrons is possible....See full product

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