Request InfoMKS Ophir, Light & MeasurementThe Ophir® SP920G GigE Silicon CCD beam profiling camera accurately captures and analyzes wavelengths from 190 to 1100 nm. Features include high-speed GigE interface, compact design, wide dynamic range, and unparalleled signal-to-noise ratio for measuring CW and pulsed lasers in industrial applications. 1624- × 1224-pixel resolution, 4.4-µm pixel pitch. Includes BeamGage® advanced beam analysis software.See full productRelated content from Photonics MediaPRODUCTSVision-Spectra.com June 2022 IssueFluorescence Imaging SolutionThe Fluorescence Imaging Solution from TPL Vision UK is a multi-UV dome device, bringing safety and flexibility to UV fluorescence imaging applications. Users can test and select multiple UV...Photonics Spectra February 2023 IssueMobile SpectrometerThe MOBILE-IR II portable, battery-powered Fourier Transform Infrared (FT-IR) spectrometer from Bruker Optics GmbH & Co. KG brings laboratory-grade analysis to the field. 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