Request InfoBaumer Ltd.SOUTHINGTON, Conn., Nov. 1, 2011 — For fast and efficient automated optical inspection of solar wafers, Baumer Ltd. USA has introduced its HXC20NIR and HXC40NIR CMOS cameras, which measure electroluminescence and deliver high sensitivity in the near-infrared spectrum. The company says that the cameras are twice as sensitive as monochrome technology at a wavelength of 900 nm, using electroluminescence to effectively detect fractures and failures in the crystal structure of the solar wafer. The images produced yield information on the integrity and effectiveness of each wafer prior to the next processing step. Structural...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 2/26/2024VideoscopeThe IPLEX™ TX II from Evident is a videoscope for remote visual inspection applications. 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