Request InfoLECO Corp.The IA32 image analysis system from Leco Corp. can determine nodularity, coating thickness, grain size, porosity, particle size and fiber length. It includes Windows-based software, and single-sample and sample-set modes of operation. Application-specific command buttons, a professional-grade report designer and application wizards also are provided. Data can be exported for further processing and archiving, and images can be saved within the operating system or downloaded onto a CD-ROM.See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra May 2024 IssueLaser InterferometerThe Qualifire™ from Zygo Corporation is a laser interferometer designed to support metrology applications in industries such as semiconductor, lithography, space-borne imaging systems,...Promoted Content September 2023 IssueCustom Cylindrical OpticsK&S Optics manufactures cylindrical lenses in a wide variety of configurations to fit your specifications and prints. 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