Request InfoJEOL USA Inc.JEOL USA Inc. has announced the MultiBeam SEM/FIB for focused ion beam micromilling and high-resolution scanning electron microscopy imaging in one unit. The system features the company’s S3 serial slicing and sampling technology, which enables in-process monitoring of milling, fabrication and three-dimensional image reconstruction of the sectioned area. Specifications include a 30-nA maximum milling current for high throughput, low vacuum operation, a gas-injection system, a sample stage that can accommodate wafers as large as 150 mm, an airlock sample-loading system and a multiple-port...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra January 2023 IssueMicroscopy SoftwareThe Enersight software platform from Leica Microsystems is designed for microscope inspection and quality control. 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