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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

InTouchScope SEM

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JEOL USA Inc.
PEABODY, Mass., Sept. 28, 2010 — The InTouchScope scanning electron microscope (SEM) from JEOL USA Inc. features a multitouch interface. The analytical, low-vacuum instrument features integrated energy dispersive spectroscopy analysis with the latest silicon drift detector technology. It has the feel of today’s personal electronic media. The intuitive multitouch screen interface puts all SEM apps at the operator’s fingertips. The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters, analytical functions, or measure...See full product

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