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Innova-IRIS TERS-Ready AFM System

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Bruker Nano Surfaces
TUCSON, Ariz., Dec. 1, 2011 — Bruker Corp.’s Nano Surfaces Div. has released the Innova-IRIS, an integrated system for correlated atomic force microscopy (AFM) and Raman spectroscopic imaging. Its ultralow closed-loop noise, no-drift mechanical stability and wide-open optical access make it a suitable platform for tip-enhanced Raman spectroscopy (TERS) research. With hardware integration designed to accelerate a TERS setup, and an IRIS software module that offers automated mapping, the system transforms AFM and Raman instruments into TERS-enabled research platforms. The company says that researchers have had...See full product

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