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Inspection System

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Nanotronics Imaging
SAN FRANCISCO, July 19, 2016 — Nanotronics offers the nSpec 2.0, a comprehensive inspection system for fabrication plants and laboratories. The system features advanced machine learning and image processing algorithms that analyze fully patterned wafers and large devices. The device can locate and classify any feature or defect, from subnanometer through millimeters and centimeters, in materials that are transparent, semitransparent and opaque, and at every stage of production.See full product

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