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Inspection and Metrology Platform

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WILMINGTON, Mass., Oct. 1, 2018 — The Dragonfly G2 inspection and metrology platform from Rudolph Technologies Inc. increases options for advanced-packaging customers to meet their wafer-based application challenges on a single platform. The system incorporates the benefits of the company’s Firefly system onto the Dragonfly platform, including higher sensitivity and throughput, along with proprietary Clearfind Technology. To date, customer evaluations have reported throughput increases greater than 50 percent over the first-generation Dragonfly system. The Dragonfly G2 system achieves significant throughput and...See full product

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