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Zurich Instruments AG - Lock-In Amplifiers 4/24 LB

Ion Beam Microscopes

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Carl Zeiss Microscopy LLC
THORNWOOD, N.Y., Aug. 29, 2019 — The Crossbeam 350 and Crossbeam 550 ion beam microscopes from Carl Zeiss Microscopy LLC cover advancements in analytics, tomography, sample preparation, and data integrity. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) detection is included, with an added SIMS solution for elemental analysis. Enhanced workflows for 3D tomography ensure 3D data volume generation. Quantified and calibrated measurement of z-slice thickness allows for proper reconstruction of tomogram slices into a reconstructed volume. An update of the ZEISS Atlas 5 hardware and software package improves 3D...See full product

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