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JSM-7001F Analytical SEM

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JEOL USA Inc.
PEABODY, Mass., March 13, 2007 -- The JSM-7001F, a new thermal field-emission analytical scanning electron microscope (SEM) from electron optical product maker JEOL USA, acquires high-resolution micrographs at up to 1,000,000X magnification for applications ranging from semiconductors, metals, minerals, materials and ceramics to nonconductive biological samples. The JSM-7001F features a unique in-lens field emission gun that delivers more than 200 nA of beam current to the sample. An extremely small probe diameter at low kV and high current is optimal for characterization of nanostructures with a resolution of 1.2 nm at...See full product

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