Close

Search

Search Menu
Photonics Media Photonics Marketplace Photonics Spectra BioPhotonics EuroPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook

JSM-IT300LV Scanning Electron Microscope

Facebook Twitter LinkedIn Email Comments
Request Info
JEOL USA Inc.
The JSM-IT300LV scanning electron microscope (SEM) from JEOL USA features an expanded pressure range, large specimen chamber and improved resolution for imaging and characterizing a variety of sample types and sizes. The SEM extends vacuum pressure range to 10 to 650 pA; in low-vacuum mode, this enhances imaging capability for samples that are wet or oily, that outgas excessively or that are nonconductive without pretreatment. The device features multiple ports for analytical attachments such as energy-dispersive x-ray spectrometers, electron backscatter diffraction,...See full product

Related content from Photonics Media



    PRODUCTS


    ARTICLES


    PHOTONICS HANDBOOK ARTICLES


    WHITEPAPERS


    WEBINARS


    PHOTONICS DICTIONARY+ TERMS


    VIDEOS


    PHOTONICS BUYERS' GUIDE CATEGORIES


    COMPANIES


    back to top
    Facebook Twitter Instagram LinkedIn YouTube RSS
    ©2020 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, [email protected]

    Photonics Media, Laurin Publishing
    x Subscribe to Photonics Spectra magazine - FREE!
    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.