Request InfoBruker Nano SurfacesBruker Corp. has released the PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes (AFMs). It uses frequency-modulation detection to provide high-spatial-resolution Kelvin probe data. It builds on proprietary PeakForce Tapping technology to provide directly correlated quantitative nanomechanical data, which improves the sensitivity of the frequency-modulation measurement and eliminates artifacts. PeakForce KPFM provides automated parameter setup with ScanAsyst, improving quantitative surface potential data for materials research and semiconductor...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra May 2024 IssueJoulemeterThe IS50A-1KW-RMT from Gentec-EO is a high-power joulemeter for laser energy measurement up to 1 kW average power. 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