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Large-Angle EDS for STEMs

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JEOL USA Inc.
PEABODY, Mass., July 12, 2011 — JEOL USA Inc. has developed an energy-dispersive spectrometer (EDS) for ultrafast, ultrasensitive collection of x-rays through analysis with its scanning transmission electron microscopes (STEMs). The Centurio is a silicon drift detector energy-dispersive spectrometer that collects x-rays from samples at a large solid angle of up to 0.98 steradians from a detection area of 100 mm2. The larger the solid angle of measurement, the more data the EDS collects to construct detailed analytical maps of the elements in the sample. With the ability to efficiently collect x-rays at very high...See full product

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