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Stanley Electric Co. Ltd. - IR Light Sources 4/24 LB

Light Probes Wafers Nondestructively

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PicoQuant GmbH
•    decay down to 10 ps •    laser or LED excitation source •    wafers up to 10 cm PicoQuant GmbH has a new version of its WaferCheck 150 that characterizes semiconductor materials for research and production purposes. It uses a nondestructive noncontact light probe to measure the time response of optoelectronic devices and performs quality checks on semiconductor processes and products, including photodetectors, GaAs/GaN wafers and solar cells, laser diodes and bright LEDs. The instrument uses time-resolved photoluminescence to measure the electron-hole...See full product

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