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Line Scan SWIR InGaAs Detectors

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Xenics
LEUVEN, Belgium, Feb. 7, 2018 — The XLIN-FC series of line scan SWIR indium gallium arsenide (InGaAs) detectors from Xenics NV are suitable for applications in machine vision and spectroscopy. Using flip-chip (FC)-type hybridization, two detector types are offered: the XLIN-FC R with rectangular pixels for spectroscopy applications and the XLIN-FC SQ with square pixels for machine vision inspection applications. The detectors operate in low-illumination conditions due to a new high-sensitivity read-out integrated circuit developed in-house. The InGaAs photodetectors also exhibit a high quantum efficiency in the 900-...See full product

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