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MEMS METROLOGY

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Veeco Instruments Inc.
Veeco Metrology Group has added dynamic MEMS measurement capability to its Wyko NT1100 optical profiler. This option allows three-dimensional characterization of microdevices as they actuate for assessing their functionality and measuring in- and out-of-plane dimensions. It includes a custom illumination source, electronics and SureVision analysis software, which can be used to determine parameters such as resonant frequency, radius of curvature, shape/distortion and deflection. The system captures a series of 3-D measurements and generates a video of the device as it cycles through its range...See full product

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