Request InfoVeeco Instruments Inc.Veeco Metrology Group has added dynamic MEMS measurement capability to its Wyko NT1100 optical profiler. This option allows three-dimensional characterization of microdevices as they actuate for assessing their functionality and measuring in- and out-of-plane dimensions. It includes a custom illumination source, electronics and SureVision analysis software, which can be used to determine parameters such as resonant frequency, radius of curvature, shape/distortion and deflection. The system captures a series of 3-D measurements and generates a video of the device as it cycles through its range...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 7/3/2023Benchtop X-Ray Diffraction PlatformBruker’s D6 PHASER X-Ray Diffraction (XRD) system is a benchtop XRD platform designed with analytical flexibility typically only available in larger, floor-standing systems. 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