Request InfoOlympus Europa SE & Co. KGOlympus Life Science Europa GmbH has unveiled an infrared confocal laser scanning microscope for nondestructive observation of the interior of silicon wafers, integrated circuit chips and microelectromechanical systems. The OLS3000IR LEXT uses a 1310-nm laser to see through the silicon to the components, enabling inspection, measurement and analysis of system in package, 3-D mounting and chip scale package. Applications include flip chip mounting defect analysis, chip damage analysis and chip gap measurement.See full productRelated content from Photonics MediaPRODUCTSPromoted Content March 2024 IssueRaman MicroscopeThe alpha300 Semiconductor Edition from WITec is a Raman microscope configured especially for semiconductor research and development. 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