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Bristol Instruments, Inc. - 872 Series High-Res 4/24 LB

Measurement System

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Nanolane
The Sarfus Mapping Lite measurement system unveiled by Nanolane, the nanotechnologies department of Eolane, accommodates any optical microscope setup functioning with reflected light. It is designed for imaging nanometric objects such as nanotubes, nanowires, DNA strands and nanoparticles. It enables measurement of thin films as well as surface treatment of nanometric thickness. Easy to use, it comprises a set of Surf slides onto which users can deposit their samples. Surfs replace ordinary microscope glass slides, and users handle their optical microscope as usual, except that the...See full product

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