Request InfoPhaseViewNORTHAMPTON, England, July 3, 2007 -- MicroPhase from PhaseView is a three-dimensional topography device suitable for surface characterization and 3-D measurements such as profiles, heights, roughness and waviness parameters. MicroPhase turns any microscope or stereomicroscope into a 3-D metrology device with no alteration of standard microscopy observation modes. The video CCD camera can be used with any transmission or reflection microscope equipped with a video port, with no additional optical components or accessories. Unlike complex metrology equipment, MicroPhase relies on fully digital algorithms. With no complex...See full productRelated content from Photonics MediaPRODUCTSPromoted Content March 2024 IssueMadAFM™ sample scanning AFMThe MadAFM™ is a new multimodal sample scanning AFM. Simple to install with compact tabletop design. 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