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Microscopy Simplification System

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Hitachi High-Tech Corp.
TOKYO, July 29, 2016 — Hitachi High-Technologies Corp. has announced the MirrorCLEM system for simplifying correlative light and electron microscopy. The system supports quick and accurate correlative light electron microscopy (CLEM) analysis by using a field emission scanning electron microscope (FE-SEM). With this system, the plastic sections can be observed under a light microscope from low magnifications to magnifications that are high enough to clearly observe the structure of interest. In addition, the FE-SEM stage can be coordinated to the target position in the low-magnification image which is...See full product

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