Request InfoHitachi High-Tech Corp.TOKYO, July 29, 2016 — Hitachi High-Technologies Corp. has announced the MirrorCLEM system for simplifying correlative light and electron microscopy. The system supports quick and accurate correlative light electron microscopy (CLEM) analysis by using a field emission scanning electron microscope (FE-SEM). With this system, the plastic sections can be observed under a light microscope from low magnifications to magnifications that are high enough to clearly observe the structure of interest. In addition, the FE-SEM stage can be coordinated to the target position in the low-magnification image which is...See full productRelated content from Photonics MediaPRODUCTSBioPhotonics Nov/Dec 2022 IssueHolotomography MicroscopeThe HT-X1 high-resolution holotomography microscope from Tomocube Inc. features an incoherent light source and is suited for higher-throughput and automated screening applications. 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Paulson School of Engineering and Applied Sciences have developed a single flat lens that can focus the entire visible spectrum of light in the same spot and in...Photonics.com 10/14/2021BWT - Shenzhen International Laser and Intelligent Equipment, Optoelectronic Technology Expo (LFSZ 2021)At the exhibition, BWT exhibited more than 20 types of diode lasers, fiber lasers, and ultrafast lasers.Photonics.com 10/12/2021BWT- Brand Upgrade VideoNew start, new image BWT provides you with unchanging high-quality products and services. We are committed to becoming a global leader in laser solutions, let the dream drive the light, and inspire...Photonics.com 5/5/2017Lasers & Bacteria: Saving Lives - LIGHT MATTERS 04.2017Millions of unexploded landmines and ordnance from World War II are still buried in countries around the world, injuring hundreds of thousands of people every year. 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