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Deposition Sciences Inc. - Difficult Coatings - LB - 8/23

Microspectrophotometer

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CRAIC Technologies
For the semiconductor industry, Craic Technologies Inc. has developed the 20/20 XL, a film thickness measurement tool. The microspectrophotometer nondestructively analyzes and images microscopic areas of very large samples. Thin-film thickness can be measured in both transmission and reflectance. The system measures the Raman spectra of microscopic samples and performs ultraviolet and near-infrared microscopy of semiconductor and other types of samples. Applications include mapping thin-film thickness of large devices, locating and identifying contaminants, and measuring strain in silicon....See full product

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