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NanoCam Sq Dynamic Profiler

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4D Technology Corporation
TUCSON, Ariz., March 1, 2011 — For 3-D measurement of surface roughness on large polished optics and optical quality surfaces, despite vibration or turbulence, 4D Technology Corp. has released the NanoCam Sq dynamic profiler. The instrument replaces the slow, messy replication methods required by traditional workstation interferometers. By enabling on-machine roughness metrology, it reduces handling and transportation of the optic, increasing throughput and reducing the risk of damage to expensive, mission-critical optics. It uses Dynamic Interferometry, incorporating a high-speed optical sensor that measures...See full product

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