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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

NanoWizard Ultra Speed AFM

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Bruker Nano GmbH, JPK BioAFM
JPK Instruments AG’s next-generation NanoWizard Ultra Speed AFM (atomic force microscope) delivers fast scanning and superresolution on an inverted microscope for applications including the study of biological or other soft-matter systems. The device provides real-time tracking changes in samples imaged in air or liquid. Its low-noise scanner, position sensor and detection system enable line-rate scanning speeds >100 Hz in closed-loop mode, while a proprietary Quantitative Imaging mode provides quantitative material property mapping. A tip-scanning design and proprietary...See full product

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