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BAE Systems Sensor Solutions - Fairchild - Thermal Imaging Solutions 4/24 LB

New Pulse Measurement System

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Keithley Instruments Inc.
CLEVELAND, Ohio, July 27 -- Keithley Instruments Inc. has introduced pulse generation and measurement in its 4200-SCS semiconductor characterization system with a PIV (pulse I-V) package that it says enables better measurements and faster time-to-market for researchers working with high-k (high dielectric constant) materials, thermally sensitive devices and advanced memory chips. The PIV package is an option for Keithley's 4200-SCS system, which performs laboratory-grade DC device characterization, real-time plotting and analysis with high-precision subfemtoamp resolution. It offers the most...See full product

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