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Gentec Electro-Optics Inc   - Measure With Gentec Accuracy LB

New Pulse Measurement System

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For Semiconductor Device Characterization
Keithley Instruments Inc.
CLEVELAND, Ohio, July 27 -- Keithley Instruments Inc. has introduced pulse generation and measurement in its 4200-SCS semiconductor characterization system with a PIV (pulse I-V) package that it says enables better measurements and faster time-to-market for researchers working with high-k (high dielectric constant) materials, thermally sensitive devices and advanced memory chips. The company said it is the first product of its kind to offer accurate and repeatable pulse and DC measurements in an integrated package. The PIV package is an option for Keithley's 4200-SCS system, which performs...See full product

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