Request InfoTaylor Hobson Ltd.Taylor Hobson Ltd. has announced a new noncontact profiler for quantitative measurements of 3-D form and roughness features. Based on coherence correlation interferometry (CCI) technology, the CCI MP-L provides nanometer resolution and a large field of view. It features a 1024 × 1024-pixel array and a closed-loop, piezoless Z-axis scanner to provide a 500-μm vertical range. 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